Most hardware engineers currently rely solely on experience for PCB design, facing challenges in debugging due to inaccessible signal lines. EMC testing in standard facilities primarily focuses on external radiation, leading to iterative modifications and delays. Simulation tools often lack accurate device models, hindering effective EMC and SI simulations. The determination of signal return paths in multi-layer PCBs is complex, influencing electromagnetic radiation. However, near-field scanning methods like Emscan offer a solution by detecting high-frequency currents, aiding in identifying EMI problems before standard tests.